Imaging microscopy with x-ray lasers at LLNL

Luiz B. Da Silva; James E. Trebes; Stan J. Mrowka; Brian J. MacGowan; Jeffrey A. Koch; Dennis L. Matthews; Troy W. Barbee; Rod Balhorn; Joe W. Gray; Erik H. Anderson; D. Kern; David T. Attwood

Imaging microscopy with x-ray lasers at LLNL

Luiz B. Da Silva, James E. Trebes, Stan J. Mrowka, Brian J. MacGowan, Jeffrey A. Koch, Dennis L. Matthews, Troy W. Barbee, Rod Balhorn, Joe W. Gray, Erik H. Anderson, D. Kern, David T. Attwood

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Imaging microscopy with short pulse (200 ps) x-ray lasers offers the opportunity of high resolution three-dimensional imaging of specimens in an aqueous environment without the blurring effects associated with natural motion. As a first step toward this goal we have performed imaging experiments which clearly resolved 500 angstrom features on a gold test pattern. In addition, we have taken images of dried biological specimens as a basis for comparison in future wet specimen imaging. The results of these experiments are described. We also discuss some of the alignment problems involved in doing x-ray microscopy with low repetition rate systems where in situ focusing of the imaging optics is not practical as single shot exposures can alter the specimen.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Publisher	Publ by Int Soc for Optical Engineering
Pages	154-159
Number of pages	6
ISBN (Print)	0819409146
State	Published - Jan 1 1993
Externally published	Yes
Event	Soft X-Ray Microscopy - San Diego, CA, USA Duration: Jul 19 1992 → Jul 21 1992

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1741
ISSN (Print)	0277-786X

Other

Other	Soft X-Ray Microscopy
City	San Diego, CA, USA
Period	7/19/92 → 7/21/92

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Cite this

Da Silva, L. B., Trebes, J. E., Mrowka, S. J., MacGowan, B. J., Koch, J. A., Matthews, D. L., Barbee, T. W., Balhorn, R., Gray, J. W., Anderson, E. H., Kern, D., & Attwood, D. T. (1993). Imaging microscopy with x-ray lasers at LLNL. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 154-159). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1741). Publ by Int Soc for Optical Engineering.

Imaging microscopy with x-ray lasers at LLNL. / Da Silva, Luiz B.; Trebes, James E.; Mrowka, Stan J. et al.
Proceedings of SPIE - The International Society for Optical Engineering. Publ by Int Soc for Optical Engineering, 1993. p. 154-159 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1741).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Da Silva, LB, Trebes, JE, Mrowka, SJ, MacGowan, BJ, Koch, JA, Matthews, DL, Barbee, TW, Balhorn, R, Gray, JW, Anderson, EH, Kern, D & Attwood, DT 1993, Imaging microscopy with x-ray lasers at LLNL. in Proceedings of SPIE - The International Society for Optical Engineering. Proceedings of SPIE - The International Society for Optical Engineering, vol. 1741, Publ by Int Soc for Optical Engineering, pp. 154-159, Soft X-Ray Microscopy, San Diego, CA, USA, 7/19/92.

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Imaging microscopy with x-ray lasers at LLNL

Abstract

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ASJC Scopus subject areas

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