Implementation of Optical Interconnections for VLSI

Wennie H. Wu, Larry A. Bergman, Alan R. Johnston, Clark C. Guest, Sadik C. Esener, P. K.L. Yu, Michael R. Feldman, Sing H. Lee

Research output: Contribution to journalArticlepeer-review

52 Scopus citations


This paper reports on the progress in implementing optical interconnections for VLSI. Four areas are covered: 1) the holographic optical element (HOE), 2) the laser sources, 3) the detectors and associated circuits forming an optically addressed gate, and 4) interconnection experiments in which five gates are actuated from one source. A laser scanner system with a resolution of 12 μm × 20 μm has been utilized to generate the HOE's. Diffraction efficiency of the HOE and diffracted spot size have been measured. Stock lasers have been modified with a high-frequency package for interconnect experiments, and buried heterostructure fabrication techniques have been pursued. Measurements have been made on the fabricated photodetectors to de-detectors to determine dark current, responsivity and response time. The optical gates and the overall chip have been driven successfully with an input light beam, as well as with the optical signal interconnected through the one to five hologram.

Original languageEnglish (US)
Pages (from-to)706-714
Number of pages9
JournalIEEE Transactions on Electron Devices
Issue number3
StatePublished - Mar 1987
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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