Projecting two-axis nanometer scale displacement of microscopic beads onto a quadrant photodetector with a laser beam

Daqun Li; Bruce J. Schnapp

doi:10.1063/1.1148049

Projecting two-axis nanometer scale displacement of microscopic beads onto a quadrant photodetector with a laser beam

Research output: Contribution to journal › Article › peer-review

Abstract

A quadrant photodetector has been added onto a custom differential interference contrast microscope to measure two-axis displacement of silica beads with a noise ≤s0.1 nm/√Hz below 150 Hz. A diode-pumped solid-state laser is incorporated to function not only as a light source for displacement detection but also as an optical trap for motility studies of protein motors. This system is designed for studies in which the motility needs to be simultaneously monitored along both axes at nm accuracy.

Original language	English (US)
Pages (from-to)	3920-3921
Number of pages	2
Journal	Review of Scientific Instruments
Volume	68
Issue number	10
DOIs	https://doi.org/10.1063/1.1148049
State	Published - Oct 1997
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1148049

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abstract = "A quadrant photodetector has been added onto a custom differential interference contrast microscope to measure two-axis displacement of silica beads with a noise ≤s0.1 nm/√Hz below 150 Hz. A diode-pumped solid-state laser is incorporated to function not only as a light source for displacement detection but also as an optical trap for motility studies of protein motors. This system is designed for studies in which the motility needs to be simultaneously monitored along both axes at nm accuracy.",

author = "Daqun Li and Schnapp, {Bruce J.}",

year = "1997",

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Projecting two-axis nanometer scale displacement of microscopic beads onto a quadrant photodetector with a laser beam

Abstract

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